activity
20102021
most citedOrbital reflectometry

239 citations · 866 across the 11 of their papers we have counts for

collaborators

11 papers

cond-mat.str-el2021

Intrinsic versus extrinsic orbital and electronic reconstructions at complex oxide interfaces

R. J. Green, V. Zabolotnyy, M. Zwiebler +10

The interface between the insulators LaAlO and SrTiO accommodates a two-dimensional electron liquid (2DEL) -- a high mobility electron system exhibiting superconductivity a…

cond-mat.str-el2019★ 52 cited

Complex magnetic order in nickelate slabs

Matthias Hepting, Robert J. Green, Zhicheng Zhong +18

Magnetic ordering phenomena have a profound influence on the macroscopic properties of correlated-electron materials, but their realistic prediction remains a formidable challenge.…

cond-mat.mtrl-sci2017★ 79 cited

Thickness dependent properties in oxide heterostructures driven by structurally induced metal-oxygen hybridization variations

Zhaoliang Liao, Nicolas Gauquelin, Robert J. Green +16

Thickness driven electronic phase transitions are broadly observed in different types of functional perovskite heterostructures. However, uncertainty remains whether these effects…

cond-mat.str-el2016★ 48 cited

Quantitative determination of bond order and lattice distortions in nickel oxide heterostructures by resonant x-ray scattering

Y. Lu, A. Frano, M. Bluschke +10

We present a combined study of Ni -edge resonant x-ray scattering and density functional calculations to probe and distinguish electronically driven ordering and lattice distort…

cond-mat.str-el2015

Extreme mobility enhancement of two-dimensional electron gases at oxide interfaces via charge transfer induced modulation doping

Y. Z. Chen, F. Trier, T. Wijnands +22

The discovery of two-dimensional electron gases (2DEGs) at the interface between two insulating complex oxides, such as LaAlO3 (LAO) or gamma-Al2O3 (GAO) epitaxially grown on SrTiO…

cond-mat.mes-hall2015★ 24 cited

Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity

M. Zwiebler, J. E. Hamann-Borrero, M. Vafaee +8

The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-r…