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physics.optics2023★ 1 cited
Precise Measurement of Refractive Indices in Thin Film Heterostructures
Lukas W. Perner, Gar-Wing Truong, David Follman +5
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by…
physics.optics2023★ 20 cited
Simultaneous Measurement of Mid-Infrared Refractive Indices in Thin-Film Heterostructures: Methodology and Results for GaAs/AlGaAs
Lukas W. Perner, Gar-Wing Truong, David Follman +5
We present our results for simultaneous measurement of the refractive indices of gallium arsenide (GaAs) and aluminum gallium arsenide (AlGaAs) from $2.…