activity
20022023
most citedDomain wall creep in epitaxial ferroelectric Pb(Zr0.2Ti0.8)O3 thin films

559 citations · 1.3k across the 16 of their papers we have counts for

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Showing cond-mat.dis-nnShow all

6 papers · 1 filter

cond-mat.dis-nn2021★ 5 cited

Dynamic response and roughening of ferroelectric domain walls driven at planar electrode edges

Guillaume Rapin, Sophia Ehrensperger, Cédric Blaser +2

Understanding and controlling the motion, stability, and equilibrium configuration of ferroelectric domain walls is key for their integration into potential nanoelectronics applica…

cond-mat.dis-nn2021★ 10 cited

A numerical study of the statistics of roughness parameters for fluctuating interfaces

Sebastian Bustingorry, Jill Guyonnet, Patrycja Paruch +1

Self-affine rough interfaces are ubiquitous in experimental systems, and display characteristic scaling properties as a signature of the nature of disorder in their supporting medi…

cond-mat.dis-nn2019★ 3 cited

Statistics of roughness for fluctuating interfaces: A survey of different scaling analyses

J. Guyonnet, E. Agoritsas, P. Paruch +1

Ferroic domain walls are known to display the characteristic scaling properties of self-affine rough interfaces. Different methods have been used to extract roughness information i…

cond-mat.dis-nn2012★ 46 cited

Thermal quench effects on ferroelectric domain walls

Patrycja Paruch, Alejandro B. Kolton, Xia Hong +2

Using piezoresponse force microscopy on epitaxial ferroelectric thin films, we have measured the evolution of domain wall roughening as a result of heat-quench cycles up to 735C, w…

cond-mat.dis-nn2004★ 215 cited

Domain wall roughness in epitaxial ferroelectric PbZr0.2Ti0.8O3 thin films

P. Paruch, T. Giamarchi, J. -M. Triscone

The static configuration of ferroelectric domain walls was investigated using atomic force microscopy on epitaxial PbZr0.2Ti0.8O3 thin films. Measurements of domain wall roughness…

cond-mat.dis-nn2002★ 559 cited

Domain wall creep in epitaxial ferroelectric Pb(Zr0.2Ti0.8)O3 thin films

T. Tybell, P. Paruch, T. Giamarchi +1

Ferroelectric switching and nanoscale domain dynamics were investigated using atomic force microscopy on monocrystalline Pb(Zr0.2Ti0.8)O3 thin films. Measurements of domain size ve…