activity
20082024
most citedSuppression pattern of neutral pions at high transverse momentum in Au+Au collisions at sqrt(s_NN) = 200 GeV and constraints on medium transport coefficients

319 citations · 2.2k across the 40 of their papers we have counts for

collaborators

40 papers

nucl-ex2024

Measurement of elliptic flow of J in GeV AuAu collisions at forward rapidity

PHENIX Collaboration, N. J. Abdulameer, U. Acharya +365

We report the first measurement of the azimuthal anisotropy of J at forward rapidity () in AuAu collisions at GeV at the Relativistic Hea…

nucl-ex2024★ 7 cited

Centrality dependence of Lévy-stable two-pion Bose-Einstein correlations in GeV AuAu collisions

PHENIX Collaboration, N. J. Abdulameer, U. Acharya +394

The PHENIX experiment measured the centrality dependence of two-pion Bose-Einstein correlation functions in ~GeV AuAu collisions at the Relativistic Heavy…

nucl-ex2024★ 5 cited

Jet modification via -hadron correlations in AuAu collisions at GeV

PHENIX Collaboration, N. J. Abdulameer, U. Acharya +532

High-momentum two-particle correlations are a useful tool for studying jet-quenching effects in the quark-gluon plasma. Angular correlations between neutral-pion triggers and charg…

nucl-ex2023★ 13 cited

Disentangling centrality bias and final-state effects in the production of high- using direct in Au collisions at GeV

N. J. Abdulameer, U. Acharya, C. Aidala +275

PHENIX presents a simultaneous measurement of the production of direct and in Au collisions at GeV over a range of 7.5 to 18 GeV/ fo…

physics.ins-det2022★ 12 cited

A tabletop x-ray tomography instrument for nanometer-scale imaging: demonstration of the 1,000-element transition-edge sensor subarray

Paul Szypryt, Nathan Nakamura, Daniel T. Becker +28

We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial reso…

physics.ins-det2022★ 18 cited

Design of a 3000-pixel transition-edge sensor x-ray spectrometer for microcircuit tomography

Paul Szypryt, Douglas A. Bennett, William J. Boone +28

Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabr…