138 citations · 335 across the 11 of their papers we have counts for
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cond-mat.mtrl-sci2012★ 18 cited
Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
F. de la Peña, N. Barrett, L. F. Zagonel +2
Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the SiO2/Si interface as a function…
cond-mat.mtrl-sci2012★ 22 cited
Orientation-dependent surface composition of in situ annealed strontium titanate
Luiz F. Zagonel, Nicholas Barrett, Olivier Renault +5
The surface composition of polycrystalline niobium-doped strontium titanate (SrTiO3 : Nb) is studied using X-ray photoelectron emission microscopy (XPEEM) for many grain orientatio…