30 citations · 79 across the 6 of their papers we have counts for
6 papers
Initial radiometric calibration of the High-Resolution EUV Imager () of the Extreme Ultraviolet Imager (EUI) instrument onboard Solar Orbiter
S. Gissot, F. Auchère, D. Berghmans +21
The telescope was calibrated on ground at the Physikalisch-Technische Bundesanstalt (PTB), Germany's national metrology institute, using the Metrology L…
EUV fine structure and variability associated with coronal rain revealed by Solar Orbiter/EUI HRIEUV and SPICE
P. Antolin, A. Dolliou, F. Auchère +34
Coronal rain is the most dramatic cooling phenomenon of the solar corona and an essential diagnostic tool for the coronal heating properties. A puzzling feature of the solar corona…
First Perihelion of EUI on the Solar Orbiter mission
D. Berghmans, P. Antolin, F. Auchère +34
Context. The Extreme Ultraviolet Imager (EUI), onboard Solar Orbiter consists of three telescopes: the two High Resolution Imagers in EUV (HRIEUV) and in Lyman-α (HRILya), and the…
Laboratory grazing-incidence X-ray fluorescence spectroscopy as an analytical tool for the investigation of sub-nanometer CrSc multilayer water window optics
Veronika Szwedowski-Rammert, Philipp Hönicke, Meiyi Wu +9
Efficient multilayer optics for radiation in the water window range are difficult to manufacture due to extremely small layer thicknesses and severe intermixing of elements between…
Kossel interferences of proton-induced X-ray emission lines in periodic multilayers
Meiyi Wu, Karine Le Guen, Jean-Michel André +11
The Kossel interferences generated by characteristic x-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B4C/Sc multila…
Analysis of periodic Mo/Si multilayers: influence of the Mo thickness
H. Maury, Jean-Michel André, Karine Le Guen +6
A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one mul…