activity
20102022
most citedMemristor Crossbars with 4.5 Terabits-per-Inch-Square Density and Two Nanometer Dimension

538 citations · 1.3k across the 15 of their papers we have counts for

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Showing 2011Show all

5 papers · 1 filter

cond-mat.mtrl-sci2011★ 1 cited

3-D Tracking and Visualization of Hundreds of Pt-Co Fuel Cell Nanocatalysts During Electrochemical Aging

Yingchao Yu, Huolin L. Xin, Robert M. Hovden +5

We present an electron tomography method that allows for the identification of hundreds of electrocatalyst nanoparticles with one-to-one correspondence before and after electrochem…

cond-mat.mtrl-sci2011★ 3 cited

Data Processing For Atomic Resolution EELS

Paul Cueva, Robert Hovden, Julia A. Mundy +2

The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) mapping w…

cond-mat.mtrl-sci2011★ 173 cited

Atomic-resolution spectroscopic imaging of ensembles of nanocatalyst particles across the life of a fuel cell

Huolin L. Xin, Julia A. Mundy, Zhongyi Liu +8

The thousandfold increase in data-collection speed enabled by aberration-corrected optics allows us to overcome an electron microscopy paradox - how to obtain atomic-resolution che…

cond-mat.mtrl-sci2011★ 1 cited

Quantitative chemical mapping at the atomic scale

Huolin L. Xin, Christian Dwyer, David A. Muller

Atomic-scale mapping of the chemical elements in materials is now possible using aberration-corrected electron microscopes but delocalization and multiple scattering can confound i…

cond-mat.mtrl-sci2011★ 15 cited

Determining On-Axis Crystal Thickness with Quantitative Position-Averaged Incoherent Bright-Field Signal in an Aberration-corrected STEM

Huolin L. Xin, Ye Zhu, David A. Muller

An accurate determination of specimen thickness is essential for quantitative analytical electron microscopy. Here we demonstrate that a position-averaged incoherent bright-field s…