711 citations · 3.5k across the 58 of their papers we have counts for
6 papers · 1 filter
Optimal STEM Convergence Angle Selection using a Convolutional Neural Network and the Strehl Ratio
Noah Schnitzer, Suk Hyun Sung, Robert Hovden
Selection of the correct convergence angle is essential for achieving the highest resolution imaging in scanning transmission electron microscopy (STEM). Use of poor heuristics, su…
Contamination of TEM Holders Quantified and Mitigated with Open-Hardware, High-Vacuum Bakeout System
Yin Min Goh, Jonathan Schwartz, Emily Rennich +3
Hydrocarbon contamination plagues high-resolution and analytical electron microscopy by depositing carbonaceous layers onto surfaces during electron irradiation, which can render c…
The Limits of Resolution and Dose for Aberration-Corrected Electron Tomography
Reed Yalisove, Suk Hyun Sung, Peter Ercius +1
Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature. However, the high-convergence angles that enable spectacular resolution in 2D have…
Electron tomography for functional nanomaterials
Robert Hovden, David A. Muller
Modern nanomaterials contain complexity that spans all three dimensions - from multigate semiconductors to clean energy nanocatalysts to complex block copolymers. For nanoscale cha…
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law
Pratiti Deb, Michael C. Cao, Yimo Han +5
Friedel's law guarantees an inversion-symmetric diffraction pattern for thin, light materials where a kinematic approximation or a single-scattering model holds. Typically, breakin…
Dynamic Compressed Sensing for Real-Time Tomographic Reconstruction
Jonathan Schwartz, Huihuo Zheng, Marcus Hanwell +2
Electron tomography has achieved higher resolution and quality at reduced doses with recent advances in compressed sensing. Compressed sensing (CS) theory exploits the inherent spa…