most citedLogic BIST: State-of-the-Art and Open Problems

6 citations · 7 across the 2 of their papers we have counts for

collaborators

2 papers

cs.AR2015★ 6 cited

Logic BIST: State-of-the-Art and Open Problems

Nan Li, Gunnar Carlsson, Elena Dubrova +1

Many believe that in-field hardware faults are too rare in practice to justify the need for Logic Built-In Self-Test (LBIST) in a design. Until now, LBIST was primarily used in saf…

cs.OH2013★ 1 cited

Embedding of Deterministic Test Data for In-Field Testing

Nan Li, Elena Dubrova

This paper presents a new feedback shift register-based method for embedding deterministic test patterns on-chip suitable for complementing conventional BIST techniques for in-fiel…