46 citations · 176 across the 8 of their papers we have counts for
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M. Bai, K. Knorr, M. J. Simpson +6
Noncontact Atomic Force Microscopy and synchrotron x-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow tem…