77 citations · 330 across the 18 of their papers we have counts for
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Background force compensation in dynamic atomic force microscopy
Riccardo Borgani, Per-Anders Thorén, Daniel Forchheimer +4
Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of…
Imaging high-speed friction at the nanometer scale
Per-Anders Thorén, Astrid S. de Wijn, Riccardo Borgani +2
Friction is a complicated phenomenon involving nonlinear dynamics at different length and time scales[1, 2]. The microscopic origin of friction is poorly understood, due in part to…
Intermodulation electrostatic force microscopy for imaging surface photo-voltage
Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist +3
We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic…
Determining surface properties with bimodal and multimodal AFM
Daniel Forchheimer, Stanislav S. Borysov, Daniel Platz +1
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequen…
Reconstruction of Tip-Surface Interactions with Multimodal Intermodulation Atomic Force Microscopy
Stanislav S. Borysov, Daniel Platz, Astrid S. de Wijn +4
We propose a theoretical framework for reconstructing tip-surface interactions using the intermodulation technique when more than one eigenmode is required to describe the cantilev…
Simultaneous quantitative imaging of surface and magnetic forces
Daniel Forchheimer, Daniel Platz, Erik A. Tholen +1
We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic for…