activity
20092020
most citedInteraction imaging with amplitude-dependence force spectroscopy

77 citations · 284 across the 13 of their papers we have counts for

collaborators
Showing 2013Show all

6 papers · 1 filter

cond-mat.mes-hall2013★ 22 cited

Reconstruction of Tip-Surface Interactions with Multimodal Intermodulation Atomic Force Microscopy

Stanislav S. Borysov, Daniel Platz, Astrid S. de Wijn +4

We propose a theoretical framework for reconstructing tip-surface interactions using the intermodulation technique when more than one eigenmode is required to describe the cantilev…

cond-mat.mes-hall2013★ 3 cited

Simultaneous quantitative imaging of surface and magnetic forces

Daniel Forchheimer, Daniel Platz, Erik A. Tholen +1

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic for…

cond-mat.mes-hall2013

Effect of material stiffness on intermodulation response in dynamic atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén +2

We perform simulations and experiments on an oscillating atomic force microscope cantilever approaching a surface, where the intermodulation response of the cantilever driven with…

cond-mat.mes-hall2013

Polynomial force approximations and multifrequency atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholen +1

We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and…

cond-mat.mes-hall2013★ 20 cited

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén +1

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple to…

cond-mat.mes-hall2013★ 1 cited

Tip-surface interactions in dynamic atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén +1

In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions of…