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eess.IV2020★ 3 cited
Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning
Jeffrey M. Ede, Jonathan J. P. Peters, Jeremy Sloan +1
Half of wavefunction information is undetected by conventional transmission electron microscopy (CTEM) as only the intensity, and not the phase, of an image is recorded. Following…
eess.IV2019★ 46 cited
Partial Scanning Transmission Electron Microscopy with Deep Learning
Jeffrey M. Ede, Richard Beanland
Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep…