11 citations · 11 across the 2 of their papers we have counts for
2 papers
cond-mat.mes-hall2013
Characterization of intra device mutual thermal coupling in multi finger SiGe:C HBTs
Mario Weiß, Amit Kumar Sahoo, Cristian Raya +4
This paper studies the mutual coupling in trench isolated multi emitter bipolar transistors fabricated in a Si/SiGe:C HBT technology STMicroelectronics featuring fT and fmax of ~30…
cond-mat.mtrl-sci2013★ 11 cited
Electro-thermal characterization of Si-Ge HBTs with pulse measurement and transient simulation
Amit Kumar Sahoo, Sébastien Fregonese, Mario Weiß +2
This paper describes a new and simple approach to accurately characterize the transient self-heating effect in Si-Ge Heterojunction Bipolar Transistors (HBTs), based on pulse measu…