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physics.app-ph2020
An analytical solution for nonlinear dynamics of one kind of scanning probe microscopes
Sina Eftekhar, Seyyed Mostafa Mousavi Janbeh Sarayi
The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated…
physics.app-ph2020
Dynamic analysis of tapping-mode AFM with sidewall probe subjected to effects of probe mass and sidewall extension
Sina Eftekhar, Seyyed Mostafa Mousavi Janbeh Sarayi
Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects o…