22 citations · 22 across the 1 of their papers we have counts for
1 paper
O. Crauste, A. Gentils, F. Couëdo +5
a-Nb(x)Si(1-x) thin films with thicknesses down to 25 Å have been structurally characterized by TEM (Transmission Electron Microscopy) measurements. As-deposited or annealed films…