4 papers
Feedforward Compensation of Piezo Nonlinearity for High-Precision High-Speed Atomic Force Microscopy
Kenichi Umeda, Noriyuki Kodera
Atomic force microscopy (AFM) enables nanoscale characterization and has been widely applied to a broad range of systems. Over the past two decades, advances in high-speed AFM have…
Excitation frequency dependence of noise and minimum detectable force in amplitude-modulation atomic force microscopy
Kenichi Umeda, Noriyuki Kodera
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising…
Quantitative Formulation of Frequency-Dependent Average Force in AM-AFM
Kenichi Umeda, Karen Kamoshita, Noriyuki Kodera
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials…
Guidelines for Fast and Nondestructive Imaging in AM-AFM
Kenichi Umeda, Noriyuki Kodera
Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing…