collaborators

1 paper

eess.SP2026

Interlayer Error Calibration for Stacked Intelligent Metasurfaces:Modeling, Algorithms, and Future Perspectives

Xing Jia, Hao Liu, Haoxian Niu +3

Stacked intelligent metasurfaces (SIMs) have recently emerged as a key enabler for realizing electromagnetic wave-domain signal processing in next-generation wireless networks. How…