1 citations · 1 across the 2 of their papers we have counts for
Showing eess.SPShow all
2 papers · 1 filter
eess.SP2026★ 1 cited
Beam Cross Sections Create Mixtures: Improving Feature Localization in Secondary Electron Imaging
Vaibhav Choudhary, Akshay Agarwal, Vivek K Goyal
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of…
eess.SP2025
Free-running vs. Synchronous: Single-Photon Lidar for High-flux 3D Imaging
Ruangrawee Kitichotkul, Shashwath Bharadwaj, Joshua Rapp +3
Conventional wisdom suggests that single-photon lidar (SPL) should operate in low-light conditions to minimize dead-time effects. Many methods have been developed to mitigate these…