3 papers
eess.SP2026
Beam Cross Sections Create Mixtures: Improving Feature Localization in Secondary Electron Imaging
Vaibhav Choudhary, Akshay Agarwal, Vivek K Goyal
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of…
cs.CV2026
Ozone Cues Mitigate Reflected Downwelling Radiance in LWIR Absorption-Based Ranging
Unay Dorken Gallastegi, Wentao Shangguan, Vaibhav Choudhary +4
Passive long-wave infrared (LWIR) absorption-based ranging relies on atmospheric absorption to estimate distances to objects from their emitted thermal radiation. First demonstrate…
cs.CL2025
LADDER: Language-Driven Slice Discovery and Error Rectification in Vision Classifiers
Shantanu Ghosh, Rayan Syed, Chenyu Wang +5
Error slice discovery is crucial to diagnose and mitigate model errors. Current clustering or discrete attribute-based slice discovery methods face key limitations: 1) clustering r…