41 citations · 319 across the 13 of their papers we have counts for
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Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
E. Vittone, Z. Pastuovic, P. Olivero +5
The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic p…
Finite element analysis of ion-implanted diamond surface swelling
F. Bosia, P. Olivero, E. Vittone +10
We present experimental results and numerical Finite Element analysis to describe surface swelling due to the creation of buried graphite-like inclusions in diamond substrates subj…
Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization
P. Olivero, G. Amato, F. Bellotti +10
We report on a novel method for the fabrication of three-dimensional buried graphitic micropaths in single crystal diamond with the employment of focused MeV ions. The use of impla…
Controlled variation of the refractive index in ion-damaged diamond
P. Olivero, S. Calusi, L. Giuntini +6
A fine control of the variation of the refractive index as a function of structural damage is essential in the fabrication of diamond-based optical and photonic devices. We report…
Modification of the structure of diamond with MeV ion implantation
F. Bosia, N. Argiolas, M. Bazzan +5
We present experimental results and numerical simulations to investigate the modification of structural-mechanical properties of ion-implanted single-crystal diamond. A phenomenolo…
Modeling of ion beam induced charge sharing experiments for the design of high resolution position sensitive detectors
Jacopo Forneris, David Jamieson, Gabriele Giacomini +2
In a multi-electrode device, the motion of free charge carriers generated by ionizing radiation induces currents on all the electrodes surrounding the active region [1]. The amount…