19 citations · 19 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2014
Reproducible x-ray reflectometry optimization: statistical analysis of differential evolution fitting of multilayer structural models
Donald Windover, David Gil, Yasushi Azuma +1
We test the reproducibility of X-ray reflectometry(XRR) measurements and optimizations using an National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industri…
cond-mat.mes-hall2012★ 19 cited
Limitations of X-ray reflectometry in the presence of surface contamination
David L. Gil, Donald Windover
Intentionally deposited thin films exposed to atmosphere often develop unintentionally deposited few monolayer films of surface contamination. This contamination arises from the di…