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Srinivasan Raghavan

1 paper here

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cond-mat.mes-hall1
ORCID 0000-0002-4875-6144

identity via Semantic Scholar / OpenAlex

most citedHigh contrast imaging and thickness determination of graphene with in-column secondary electron microscopy

60 citations · 60 across the 1 of their papers we have counts for

collaborators

3 papers

physics.app-ph2019

H2S assisted contact engineering: a universal approach to enhance hole conduction in all TMD Field-Effect Transistors and achieve ambipolar CVD MoS2 Transistors

Ansh, Jeevesh Kumar, Ravi K Mishra +2

Unlike Si, 2-dimensional (2D) Transition Metal Dichalcogenides (TMDs) offer atomically thin channels for carrier transport in FETs. Despite advantages like superior gate control, s…

physics.app-ph2019

Chalcogen assisted contact engineering: towards CMOS integration of Tungsten Diselenide Field Effect Transistors

Ansh, J Kumar, R K Mishra +2

One of the major roadblocks for the establishment of 2D semiconductor technology for CMOS integrated circuits is lack of industry scalable doping techniques that lead to 2D FETs wi…

cond-mat.mes-hall2012★ 60 cited

High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy

Vidya Kochat, Atindra Nath Pal, Sneha E. S. +5

We report a new method for quantitative estimation of graphene layer thicknesses using high contrast imaging of graphene films on insulating substrates with a scanning electron mic…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.