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researcher

R.A. Erck

1 paper here

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author position
  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci1

identity via Semantic Scholar / OpenAlex

most citedWhite Light Interferometry for Quantitative Surface Characterization in Ion Sputtering Experiments

22 citations · 22 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2012★ 22 cited

White Light Interferometry for Quantitative Surface Characterization in Ion Sputtering Experiments

S. V. Baryshev, A. V. Zinovev, C. E. Tripa +2

White light interferometry (WLI) can be used to obtain surface morphology information on dimensional scale of millimeters with lateral resolution as good as ~1 μm and depth resolut…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.