2 papers
cs.CV2026
From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration
Ziwei Wei, Yao Shen, Wanheng Lu +2
Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and ph…
cond-mat.mtrl-sci2025
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy
Ziwei Wei, Shuming Wei, Qibin Zeng +3
We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanni…