3 papers
cs.CV2026
From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration
Ziwei Wei, Yao Shen, Wanheng Lu +2
Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and ph…
cond-mat.mtrl-sci2025
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy
Ziwei Wei, Shuming Wei, Qibin Zeng +3
We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanni…
cs.CV2024
Adaptive Prompt Learning with SAM for Few-shot Scanning Probe Microscope Image Segmentation
Yao Shen, Ziwei Wei, Chunmeng Liu +4
The Segment Anything Model (SAM) has demonstrated strong performance in image segmentation of natural scene images. However, its effectiveness diminishes markedly when applied to s…