A comparison of simulation tools for Muon-Induced X-ray Emission (MIXE) in thin films: a study case with lithium batteries

Maxime Lamotte, Michael W. Heiss, Thomas Prokscha +1

We present a comparative study of three Monte Carlo simulation frameworks -SRIM, GEANT4, and PHITS- for modeling the transport, stopping, and atomic cascade of negative muons in mi…