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cond-mat.mtrl-sci2005
Simulated ion-sputtering and Auger electron spectroscopy depth profiling study of intermixing in Cu/Co
M. Menyhárd, P. Süle
The ion-bombardment induced evolution of intermixing is studied by molecular dynamics simulations and by Auger electron spectroscopy depth profiling analysis (AESD) in Cu/Co multil…
cond-mat.mtrl-sci2005★ 1 cited
Interface-anisotropy induced asymmetry of intermixing in bilayers
P. Süle, M. Menyhárd, L. Kótis +2
The ion-sputtering induced intermixing is studied by molecular dynamics (MD) simulations and by Auger electron spectroscopy depth profiling (AES-DP) analysis in Pt/Ti/Si substrate…