Direct Observation of Electron Trapping States in SiO${}_2$ by Constant-Final-State Photoelectron Yield Spectroscopy: Insights into the Electron-Transfer Model of Contact Electrification

Renjiro Shibuya, Manato Tateno, Runa Hoshikawa +3

Understanding electrostatic charging of silicon dioxide (SiO${}_2$) is important for electrostatic control in a wide range of applications. Contact electrification (CE) is a major so…