Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)

Hyeonhee Na, Jeonghwan Oh, Jinju Lee +5

Angle-resolved photoemission spectroscopy (ARPES) requires a well-ordered surface, whose quality is routinely judged from low-energy electron diffraction (LEED) and x-ray photoelec…