collaborators

7 papers

cond-mat.mtrl-sci2026

EBSD and Subtle Crystallographic Differences - A Study of Resolving Interlayer Spacings in Nb-Ni and Nb-Co mu-phases

Lukas Berners, Nisa Ulumuddin, Annika Baum +9

In ordered intermetallics, slight variations in lattice site occupancy and specific interlayer spacings have been identified as the sources of significant changes in critical resol…

cond-mat.mtrl-sci2026

Characterizing Dislocation Substructures in Creep-Deformed Olivine Using Electron Channeling Contrast Imaging

M. Haroon Qaiser, Jessica White, David Wallis +1

Olivine is the dominant mineral in Earth's upper mantle and therefore controls mantle rheology and the mechanics of plate tectonics. The constitutive laws for dislocation-mediated…

cond-mat.mtrl-sci2026

Dynamical Simulation of On-axis Transmission Kikuchi and Spot Diffraction Patterns, Based on Accurate Diffraction Geometry Calibration

Tianbi Zhang, Raynald Gauvin, Aimo Winkelmann +1

Transmission Kikuchi diffraction in the scanning electron microscope has gained popularity as a materials characterization technique for its high throughput and nanometer-level spa…

cond-mat.mtrl-sci2026

Polar Topologies in a Ferroelastic Metal Membrane

Rahil Haria, Noah Schnitzer, T. Ben Britton +10

Polar metals, materials in which electric polarisation and metallicity coexist, are exceptionally rare because itinerant electrons screen long-range dipoles and favour centrosymmet…

cond-mat.mtrl-sci2025

Characterization of WSe films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses

Tianbi Zhang, Jakub Holzer, Tomáš Vystavěl +4

The study of thin films and 2D materials, including transition metal dichalcogenides such as WSe offers opportunities to leverage their properties in advanced sensors, quantum…

cond-mat.mtrl-sci2025

AstroECP: towards more practical Electron Channeling Contrast Imaging

M. Haroon Qaiser, Lukas Berners, Robin J. Scales +5

Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. disl…