23 citations · 29 across the 2 of their papers we have counts for
2 papers
cond-mat2002★ 6 cited
A Percolative Model of Soft Breakdown in Ultrathin Oxides
C. Pennetta, L. Reggiani, Gy. Trefan
The degradation of ultrathin oxide layers in the presence of a stress voltage is modeled in terms of two antagonist percolation processes taking place in a random resistor network.…
cond-mat2002★ 23 cited
Resistance and Resistance Fluctuations in Random Resistor Networks Under Biased Percolation
C. Pennetta, L. Reggiani, Gy. Trefán +1
We consider a two-dimensional random resistor network (RRN) in the presence of two competing biased percolations consisting of the breaking and recovering of elementary resistors.…