most citedPhotocurrent Imaging of p-n Junctions and Local Defects in Ambipolar Carbon Nanotube Transistors

95 citations · 95 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2007★ 95 cited

Photocurrent Imaging of p-n Junctions and Local Defects in Ambipolar Carbon Nanotube Transistors

Y. H. Ahn, Wei Tsen, Bio Kim +2

We use scanning photocurrent microscopy (SPCM) to investigate the properties of internal p-n junctions as well as local defects in ambipolar carbon nanotube (CNT) transistors. Our…