most citedA Probabilistic Collocation Method Based Statistical Gate Delay Model Considering Process Variations and Multiple Input Switching

47 citations · 47 across the 1 of their papers we have counts for

collaborators

1 paper

cs.AR2007★ 47 cited

A Probabilistic Collocation Method Based Statistical Gate Delay Model Considering Process Variations and Multiple Input Switching

Y. Satish Kumar, Jun Li, Claudio Talarico +1

Since the advent of new nanotechnologies, the variability of gate delay due to process variations has become a major concern. This paper proposes a new gate delay model that includ…