most citedInfluence of Ge nanocrystals and radiation defects on C-V characteristics in Si-MOS structures

5 citations · 5 across the 1 of their papers we have counts for

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1 paper

cond-mat.mes-hall2009★ 5 cited

Influence of Ge nanocrystals and radiation defects on C-V characteristics in Si-MOS structures

Shai Levy, Issai Shlimak, Avraham Chelly +2

Metal-Oxide-Semiconductor (MOS) structures containing 74Ge nanocrystals (NC-Ge) imbedded inside the SiO_2 layer were studied for their capacitance characterization. Ge atoms were i…