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physics.ins-det2010★ 2 cited
Advances in Modeling of Scanning Charged-Particle-Microscopy Images
Petr Cizmar, Andras E. Vladar, Michael T. Postek
Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images wi…
physics.ins-det2009
Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift
Petr Cizmar, Andras E. Vladar, Michael T. Postek
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion…