Measurement of the \{220\} lattice-plane spacing of a ${}^{28}$Si crystal

Enrico Massa, Giovanni Mana, Ulrich Kuetgens +1

The spacing of the \{220\} lattice planes of a ${}^{28}$Si crystal was measured by combined x-ray and optical interferometry to a $3.5\times 10^{-9}$ relative accuracy. The result is…