Free-Space Characterization Setup for Low-loss Aluminum Oxide Waveguides at 261 nm

Vahram Voskerchyan, Dawson Bonneville, Lantian Chang +1

We present a methodology for the characterization of deep-ultraviolet (UV) photonic integrated circuits (UV-PICs) based on polycrystalline Al2O3, operating at a wavelength of 261 n…