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cond-mat.mtrl-sci2011★ 15 cited
Determining On-Axis Crystal Thickness with Quantitative Position-Averaged Incoherent Bright-Field Signal in an Aberration-corrected STEM
Huolin L. Xin, Ye Zhu, David A. Muller
An accurate determination of specimen thickness is essential for quantitative analytical electron microscopy. Here we demonstrate that a position-averaged incoherent bright-field s…
cond-mat.mtrl-sci2010★ 2k cited
Imaging Grains and Grain Boundaries in Single-Layer Graphene: An Atomic Patchwork Quilt
Pinshane Y. Huang, Carlos S. Ruiz-Vargas, Arend M. van der Zande +8
The properties of polycrystalline materials are often dominated by the size of their grains and by the atomic structure of their grain boundaries. These effects should be especiall…