most citedCoherent Diffraction Imaging of Single 95nm Nanowires

34 citations · 34 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2005

In situ resonant x-ray study of vertical correlation and capping e ects during GaN/AlN quantum dots growth

J. Coraux, H. Renevier, V. Favre-Nicolin +2

Grazing incidence anomalous x-ray scattering was used to monitor in situ the molecular beam epitaxy growth of GaN/AlN quantum dots (QDs). The strain state was studied by means of g…