activity
20102012
most citedInvestigation of the Novel Attributes of a Dual Material Gate Nanoscale Tunnel Field Effect Transistor

476 citations · 485 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mes-hall2012

Bipolar Charge Plasma Transistor: A Novel Three Terminal Device

M. Jagadesh Kumar, Kanika Nadda

A distinctive approach for forming a lateral Bipolar Charge Plasma Transistor (BCPT) is explored using 2-D simulations. Different metal work-function electrodes are used to induce…

cond-mat.mes-hall2011★ 476 cited

Investigation of the Novel Attributes of a Dual Material Gate Nanoscale Tunnel Field Effect Transistor

Sneh Saurabh, M. Jagadesh Kumar

In this paper, we propose the application of a Dual Material Gate (DMG) in a Tunnel Field Effect Transistor (TFET) to simultaneously optimize the on-current, the off-current and th…

cond-mat.mes-hall2010★ 1 cited

Analytical Drain Current Model of Nanoscale Strained-Si/SiGe MOSFETs for Analog Circuit Simulation

Vivek Venkataraman, Susheel Nawal, M. Jagadesh Kumar

For nanoscale CMOS applications, strained-silicon devices have been receiving considerable attention owing to their potential for achieving higher performance and compatibility wit…

cond-mat.mes-hall2010★ 5 cited

A New Dual-Material Double-Gate (DMDG) Nanoscale SOI MOSFET - Two-dimensional Analytical Modeling and Simulation

G. Venkateshwar Reddy, M. Jagadesh Kumar1

In this paper, we present the unique features exhibited by modified asymmetrical Double Gate (DG) silicon on insulator (SOI) MOSFET. The proposed structure is similar to that of th…

cond-mat.mes-hall2010

Leakage Current Reduction Techniques in Poly-Si TFTs for Active Matrix Liquid Crystal Displays:A Comprehensive Study

Ali A. Orouji, M. Jagadesh Kumar

This paper critically examines the leakage current reduction techniques for improving the performance of poly-Si TFTs used in active matrix liquid crystal displays. This is a first…

cond-mat.mes-hall2010★ 3 cited

Controlling Short-channel Effects in Deep Submicron SOI MOSFETs for Improved Reliability: A Review

Anurag Chaudhry, M. Jagadesh Kumar

This paper examines the performance degradation of a MOS device fabricated on silicon-on-insulator (SOI) due to the undesirable short-channel effects (SCE) as the channel length is…