most citedIntrinsic Ultrathin Topological Insulators Grown via MBE Characterized by in-situ Angle Resolved Photoemission Spectroscopy

35 citations · 35 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2012★ 35 cited

Intrinsic Ultrathin Topological Insulators Grown via MBE Characterized by in-situ Angle Resolved Photoemission Spectroscopy

J. J. Lee, F. T. Schmitt, R. G. Moore +3

We demonstrate the capability of growing high quality ultrathin films of the topological insulators Bi2Se3 and Bi2Te3 using molecular beam epitaxy. Unlike previous growth technique…