3 citations · 3 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2012★ 3 cited
Sub micron-precision sample holder for accurate re-positioning of samples in Scanning Force Microscopy
José Abad, Juan Francisco González Martínez, Jaime Colchero Paetz
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on th…
cond-mat.mes-hall2010
Thermal frequency noise in low oscillation amplitude Dynamic Scanning Force Microscopy
J. Colchero, M. Cuenca, J. F. Gonzalez Martinez +3
Thermal fluctuation of the cantilever position sets a fundamental limit for the precision of any Scanning Force Microscope. In the present work we analyse how these fluctuations li…