most citedDetermining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials

2 citations · 2 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2013★ 2 cited

Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials

Donald Windover, David L. Gil, Yasushi Azuma +1

X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substra…