most citedDirect observation of nanometer-scale Joule and Peltier effects in phase change memory devices

36 citations · 36 across the 1 of their papers we have counts for

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cond-mat.mes-hall2013★ 36 cited

Direct observation of nanometer-scale Joule and Peltier effects in phase change memory devices

Kyle L. Grosse, Feng Xiong, Sungduk Hong +2

We measure power dissipation in phase change memory (PCM) devices by scanning Joule ex-pansion microscopy (SJEM) with ~50 nm spatial and 0.2 K temperature resolution. The temperatu…