most citedOn the likelihood of multiple bit upsets in logic circuits

6 citations · 6 across the 1 of their papers we have counts for

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1 paper

cs.AR2014★ 6 cited

On the likelihood of multiple bit upsets in logic circuits

Nanditha P. Rao, Shahbaz Sarik, Madhav P. Desai

Soft errors have a significant impact on the circuit reliability at nanoscale technologies. At the architectural level, soft errors are commonly modeled by a probabilistic bit-flip…