48 citations · 53 across the 2 of their papers we have counts for
2 papers
cs.AR2014★ 48 cited
TRIAD: a triple patterning lithography aware detailed router
Yen-Hung Lin, Bei Yu, David Z. Pan +1
TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG.…
cs.AR2014★ 5 cited
A High-Performance Triple Patterning Layout Decomposer with Balanced Density
Bei Yu, Yen-Hung Lin, Gerard Luk-Pat +3
Triple patterning lithography (TPL) has received more and more attentions from industry as one of the leading candidate for 14nm/11nm nodes. In this paper, we propose a high perfor…