68 citations · 69 across the 2 of their papers we have counts for
2 papers
cond-mat.mes-hall2014★ 68 cited
Investigating Atomic Contrast in Atomic Force Microscopy and Kelvin Probe Force Microscopy on Ionic Systems using Functionalized Tips
Leo Gross, Bruno Schuler, Fabian Mohn +7
Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) have become important tools for nanotechnology; however, their contrast mechanisms on the atomi…
physics.ins-det2013★ 1 cited
A setup for the study of surface processes under external homogeneous electric fields
W. Steurer, S. Surnev, F. Hanauer +2
A setup for studying the influence of external electric fields on dynamic surface processes is described. Spatially-extended homogeneous electric fields are realized by applying a…