most citedMass spectral analysis and quantification of Secondary Ion Mass Spectrometry data

8 citations · 8 across the 1 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2014★ 8 cited

Mass spectral analysis and quantification of Secondary Ion Mass Spectrometry data

A. K. Balamurugan, S. Dash, A. K. Tyagi

This work highlights the possibility of improving the quantification aspect of Cs-complex ions in SIMS (Secondary Ion Mass Spectrometry), by combining the intensities of all possib…

cond-mat.mtrl-sci2008

Fe and N self-diffusion in amorphous FeN: A SIMS and neutron reflectivity study

S. Chakravarty, M. Gupta, A. Gupta +6

Simultaneous measurement of self-diffusion of iron and nitrogen in amorphous iron nitride (Fe86N14) using secondary ion mass spectroscopy (SIMS) technique has been done. In additio…