36 citations · 83 across the 3 of their papers we have counts for
3 papers
Electronic structure and photoluminescence properties of Zn-ion implanted silica glass before and after thermal annealing
D. A. Zatsepin, A. F. Zatsepin, D. W. Boukhvalov +3
The results of XPS core-level and valence band measurements, photoluminescence spectra of a-SiO2 implanted by Zn-ions (E=30 keV, D=1*1017 cm^-2) and Density Functional Theory calcu…
Structural defects and electronic structure of N-ion implanted TiO2: bulk versus thin film
D. A. Zatsepin, D. W. Boukhvalov, E. Z. Kurmaev +4
Systematic investigation of atomic structure of N-ion implanted TiO2 (thin films and bulk ceramics) was performed by XPS measurements (core levels and valence bands) and first-prin…
XPS and DFT study of Sn incorporation into ZnO and TiO2 host matrices by pulsed ion implantation
D. A. Zatsepin, D. W. Boukhvalov, E. Z. Kurmaev +5
Bulk and thin films ZnO and TiO2 samples were doped with Sn by pulsed ion implantation and studied by means of X-ray photoelectron core-level and valence band spectroscopy as well…